周啟忠,顧亞平，陳光礻禹
(電子科技大學(xué)自動(dòng)化工程學(xué)院，四川 成都 610054)
摘要：VXI高速數(shù)字測(cè)試模塊主要用于數(shù)字板卡和數(shù)字系統(tǒng)的測(cè)試，也具有邏輯分析儀和數(shù)字信號(hào)發(fā)生器的功能。本文講述了基于VXI總線的高速數(shù)據(jù)測(cè)試模塊硬件電路設(shè)計(jì)。設(shè)計(jì)包括VXI總線接口電路，高速數(shù)據(jù)通道(FDC)傳輸電路，本地?cái)?shù)據(jù)處理電路和64路可編程I/O電路。充分結(jié)合VXI消息基接口的優(yōu)點(diǎn)，實(shí)現(xiàn)了高速數(shù)據(jù)測(cè)試;實(shí)時(shí)數(shù)據(jù)比較和故障診斷功能,并對(duì)設(shè)計(jì)過程存在的問題進(jìn)行討論。
關(guān)鍵詞：VXI總線；消息基；字串行協(xié)議；雙端口RAM
中圖分類號(hào)：TP311.12 文獻(xiàn)標(biāo)識(shí)碼：A 文章編號(hào)：1672-4984(2006)03-0089-04
Hardware design of high-speed data test module based on VXI bus
ZHOU Qi-zhong，GU Ya-ping，CHEN Guang-ju
(School of Automation Engineering,University of Electronic Science and Technology，Chengdu 610054，China)
Abstract：The VXI high-speed data test module is primary used for the test of digital modules and systems. It functions as logic analyzer and signal generator too. This paper described the hardware design of a high-speed data test module based on VXI bus. The device includes circuit of the VXI interfacing, fast data channel, local data processing 64 pins of programmable TTL digital I/O. Taking advantage of message based device, it realized high-speed data test, real-time comparison and fault diagnosis. The problems in the process of designing were also discussed.
Key words：VXI bus; Message based; Word serial protocol; Dual-port RAM
